Jülich scientists have succeeded in precisely measuring atomic spacings down to a few picometres using new methods in ultrahigh-resolution electron microscopy.
With the aid of new methods in electron optics, researchers were able to microscopically measure atomic displacements precisely to a few picometres. A picometre corresponds to a billionth of a millimetre (a trillionth of a metre) a distance that is one hundred times smaller than the diameter of an atom.
Knut Urban explains:
"This is the beginning of a new physics of materials which enables researchers to determine physical parameters and properties in the nano range through highly precise measurements of the atomic spacings. This will also provide clues on how these properties may be manipulated in order to gain new functions and better functional performance."
Publication: Studying Atomic Structures by Aberration-Corrected Transmission Electron Microscopy, Knut Urban, Science (25 July 2008)
http://www.eurekalert.org/pub_releases/2008-07/haog-eme072308.php
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